Keysight Technologies

Keysight Videos

Topic:
Agilent Technologies' Indentation University - Introduction and Overview
Recording date:
Wednesday, September 5, 2012 11:00 am
Eastern Daylight Time (New York, GMT-04:00)
Panelist Information:
Jennifer Hay, Keysight Technologies, Inc.
Duration:
58 minutes
Description:
This is the first presentation in an extended instructional series on instrumented indentation. In this inaugural presentation, program topics are reviewed which include: material properties in material science and engineering, motivations for instrumented indentation testing, contact mechanics, basic testing, dynamic testing, test-method design, and applications. Attendees are invited to suggest topics to be addressed in future sessions.
Topic:
An Introduction to Sneddon’s Stiffness Equation; Experimental Determination of Effective Indenter Shape-20120503 1403-1
Recording date:
Thursday, May 3, 2012 10:00 am
Eastern Daylight Time (New York, GMT-04:00)
Panelist Information:
Jennifer Hay, Keysight Technologies, Inc.; Benoit Merle, Uni-Erlangen
Duration:
1 hour 1 minute
Description:
Presentation #1 - Back to Basics: An introduction to Sneddon’s stiffness equation and its use in instrumented indentation
Presenter: Jennifer Hay, Agilent Technologies, Inc.

In 1965, Scottish mathematician Ian Sneddon published a general relationship relating force and displacement for two elastic bodies in contact. A derivative form of Sneddon’s relationship is often invoked for the interpretation of instrumented indentation data. This presentation will review Sneddon’s work, explain its general utility, and clarify inherent limitations.

Presentation #2 - Experimental Determination of the Effective Indenter Shape by Continuously Measuring the Unloading Stiffness
Presenter - Benoit Merle, Uni-Erlangen

The contact stiffness is an essential data required for evaluating nanoindentation experiments with the Oliver-Pharr method. It is usually calculated at the very beginning of the unloading sequence, or, using dynamic nanoindentation, continuously measured throughout the whole loading sequence. A new experimental method was developed in order to keep monitoring the contact stiffness during unloading. It is shown that the new data allows a direct measurement of the shape of the effective indenter, as previously introduced by Pharr and Bolshakov. The new method was applied to indentation on fused silica, sapphire, nanocrystalline nickel, and ultrafine-grained aluminum samples.
Topic:
Answering Really Basic Questions that AFM Novice Users are Afraid to Ask - Presented in Chinese-20111018 0204-1
Recording date:
Monday, October 17, 2011 10:00 pm
Eastern Daylight Time (New York, GMT-04:00)
Panelist Information:
Song Xu, Ph.D. Keysight Technologies
Duration:
1 hour
Description:
New AFM instrument owners often have many important questions that are not usually addressed in publications, books, and presentations: “What are the basic laboratory requirements for the instrument? What might I do that could accidentally damage the instrument? What kind of maintenance does the instrument need on a daily basis?”

We will answer many questions about basic laboratory requirements and procedures, as well as proper instrument usage and maintenance. Some of these practices are unique to AFM, such as remedies for noise-related issues and scanner calibration and adjustment, whereas some practices can be applied to other research instruments, such as strategies for dealing with thermal drift, preventing sample contamination, and ensuring a good working environment.
Topic:
Answering Really Basic Questions that AFM Novice Users are Afraid to Ask-20111018 1503-1
Recording date:
Tuesday, October 18, 2011 11:00 am
Eastern Daylight Time (New York, GMT-04:00)
Panelist Information:
Eastern Daylight Time (New York, GMT-04:00)
Duration:
1 hour 10 minutes
Description:
New AFM instrument owners often have many important questions that are not usually addressed in publications, books, and presentations: “What are the basic laboratory requirements for the instrument? What might I do that could accidentally damage the instrument? What kind of maintenance does the instrument need on a daily basis?”

We will answer many questions about basic laboratory requirements and procedures, as well as proper instrument usage and maintenance. Some of these practices are unique to AFM, such as remedies for noise-related issues and scanner calibration and adjustment, whereas some practices can be applied to other research instruments, such as strategies for dealing with thermal drift, preventing sample contamination, and ensuring a good working environment.
Topic:
Back to Basics: Force-Distance Curve Data and Force Curve Applications for SPM-20120301 0210-1
Recording date:
Wednesday, February 29, 2012 9:00 pm
Eastern Standard Time (New York, GMT-05:00)
Panelist Information:
Zhi-Wen Liu, PhD Keysight Technologies, Inc.
Duration:
1 hour 4 minutes
Description:
The “force-distance curve” is a basic and important SPM function. The issue of how this data should be treated can be a difficult one. This seminar will focus on how to treat the data, as well as offer advice on force curve applications in biology and materials science. Topics include how to acquire the force-distance curve, how to compute the spring constant using Thermal K, several basic models (e.g., Hertz, JKRS, and DMT), how to treat the curve data, and advice on force curve applications (e.g., elastic constant, Young’s modulus, adhesion function, and water film thickness).
Topic:
Back to Basics: SPM Techniques and Skills for Dealing with Difficult Samples-20120308 0205-1
Recording date:
Wednesday, March 7, 2012 9:00 pm
Eastern Standard Time (New York, GMT-05:00)
Panelist Information:
Song Xu, PhD Keysight Technologies
Duration:
52 minutes
Description:
This seminar will focus on the techniques and skills needed for work with difficult samples, using actual examples to illustrate possible solutions to unique problems. These examples include micron-size particles (e.g., starch and powder), bacteria, live cells, STM imaging of an electrode made of a tiny gold sphere at the end of a wire, nanoparticles 1-10 nm in size, polymer samples with electrostatic charge, very rough samples, and very soft samples.
Topic:
Agilent Indentation University - Introduction and Overview - Presented in Chinese-20121010 0205-1
Recording date:
Tuesday, October 9, 2012 10:00 pm
Eastern Daylight Time (New York, GMT-04:00)
Panelist Information:
Cunyi Xie, Ph.D., Keysight Technologies, Inc.
Duration:
1 hour 2 minutes
Description:
This is the first presentation in an extended instructional series on instrumented indentation. In this inaugural presentation, program topics are reviewed which include: material properties in material science and engineering, motivations for instrumented indentation testing, contact mechanics, basic testing, dynamic testing, test-method design, and applications. Attendees are invited to suggest topics to be addressed in future sessions.
Topic:
Back to the Basics: Techniques and Skills for Difficult AFM Samples -20120426 1505-1
Recording date:
Thursday, April 26, 2012 11:00 am
Eastern Daylight Time (New York, GMT-04:00)
Panelist Information:
Song Xu, Ph.D., Keysight Technologies, Inc.
Duration:
1 hour
Description:
Some of us AFM users have this experience: following the instrument manual, we could easily image most of the sample easily and quickly. As a matter of fact, 80% of the AFM work done at a centralized facility is simple imaging of easy samples in air. However, many of us are also confronted with difficult samples that could cost us much time and effort. Very often even after following the manual does not help make difficult samples any easier. In this web seminar, we will focus on the techniques and skills of some of the difficult samples, and use actual example to illustrate the possible solutions to unique problems.
Topic:
Basic AFM Image Processing: Techniques, Theories, and Examples - Presented in Chinese-20110927 0204-1
Recording date:
Monday, September 26, 2011 10:00 pm
Eastern Daylight Time (New York, GMT-04:00)
Panelist Information:
Song Xu, Ph.D., Keysight Technologies
Duration:
1 hour 7 minutes
Description:
Atomic force microscopy (AFM) and scanning tunneling microscopy (STM) images contain many levels of information, as well as many potential problems such as noise, misalignment, disturbance, spike, tilt, bow, and various artifacts. After acquiring an image, AFM users need to process and export the raw data into a format that can be utilized for publication and presentation. An appropriate chain of processing, filtering, and rendering allows each AFM user to display data in a way that reveals the most information via the best looking image.

We will present several steps of the basic processing that almost every image must undergo, as well as a few more advanced image processing techniques. First we will discuss a series of basic data processing steps, including plan flatten, plan de-parabola, smooth filter, median filter, FFT filter, high pass filter, and low pass filter. Then we will discuss several data rendering techniques, including 2D topography, 3D topography, and 3D topography with overlay texture mapping. Practical “real world” examples will be presented, as will the image processing’s physics and math.
Topic:
Basic AFM Image Processing: Techniques, Theories, and Examples-20110927 1502-1
Recording date:
Tuesday, September 27, 2011 11:00 am
Eastern Daylight Time (New York, GMT-04:00)
Panelist Information:
Song Xu, Ph.D, Keysight Technologies
Duration:
1 hour 8 minutes
Description:
Atomic force microscopy (AFM) and scanning tunneling microscopy (STM) images contain many levels of information, as well as many potential problems such as noise, misalignment, disturbance, spike, tilt, bow, and various artifacts. After acquiring an image, AFM users need to process and export the raw data into a format that can be utilized for publication and presentation. An appropriate chain of processing, filtering, and rendering allows each AFM user to display data in a way that reveals the most information via the best looking image.

We will present several steps of the basic processing that almost every image must undergo, as well as a few more advanced image processing techniques. First we will discuss a series of basic data processing steps, including plan flatten, plan de-parabola, smooth filter, median filter, FFT filter, high pass filter, and low pass filter. Then we will discuss several data rendering techniques, including 2D topography, 3D topography, and 3D topography with overlay texture mapping. Practical “real world” examples will be presented, as will the image processing’s physics and math.
Topic:
Indentation University Session 5: The Onset of Plasticity in Indentation-20130206 1603-1
Recording date:
Wednesday, February 6, 2013 11:00 am
Eastern Standard Time (New York, GMT-05:00)
Panelist Information:
Jennifer Hay, Factory Application Engineer, Keysight Technologies, Inc.
Duration:
1 hour 6 minutes
Description:
Design and analysis of instrumented indentation experiments require knowing the threshold and locus for the onset of plasticity. In this session, we use the Tresca criterion to understand the onset of plasticity for both Hertzian and conical indentation. For Hertzian indentation, the onset of plasticity depends on applied load, indenter geometry, and material properties. Because conical indentation is self-similar, the onset of plasticity depends only on indenter geometry and material propertes, not applied load.
Topic:
Indentation U. Session 4: A General Modification to Sneddon's Force-Displacement Relations-20121205 1603-1
Recording date:
Wednesday, December 5, 2012 11:00 am
Eastern Standard Time (New York, GMT-05:00)
Panelist Information:
Jennifer Hay, Factory Applications Scientist, Keysight Technologies, Inc.
Duration:
45 minutes
Description:
In a 1999 publication, Jack Hay, Alexei Bolshakov, and George Pharr proposed that a factor, gamma, should modify Sneddon's force-displacement relation for a cone. Similar analysis for Hertzian contacts leads to a general expression for gamma that is appropriate for any axisymmetric punch that is smooth at the edge of contact.
Topic:
Indentation University - Session 6: Basic Instrumented Indentation to Measure Hardness and Young’s Modulus-20130313 1501-1
Recording date:
Wednesday, March 13, 2013 11:01 am
Eastern Daylight Time (New York, GMT-04:00)
Panelist Information:
Jennifer Hay, Factory Applications Scientist, Keysight Technologies, Inc.
Duration:
1 hour 10 minutes
Description:
In its most basic form, instrumented indentation involves pressing an indenter of known geometry into a test surface while continuously monitoring force and displacement. In this session, we review the basic test and analysis commonly known as the “Oliver-Pharr” method for measuring hardness and Young’s modulus. The continuous measurement of force and displacement affords two important advantages over traditional hardness testing. First, the contact area can be analytically inferred and does not have to be optically measured. Second, the displacements measured during unloading manifest elastic recovery, and thus are a means for deriving Young’s modulus by means of previously developed elastic contact models.
Topic:
Indentation University - Session 6: Basic Instrumented Indentation to Measure Hardness and Young’s Modulus - Presented in Chinese-20130417 0201-1
Recording date:
Tuesday, April 16, 2013 10:01 pm
Eastern Daylight Time (New York, GMT-04:00)
Panelist Information:
Cun-yi Xi, Ph.D., Keysight Technologies, Inc.
Duration:
1 hour 2 minutes
Description:
In its most basic form, instrumented indentation involves pressing an indenter of known geometry into a test surface while continuously monitoring force and displacement. In this session, we review the basic test and analysis commonly known as the “Oliver-Pharr” method for measuring hardness and Young’s modulus. The continuous measurement of force and displacement affords two important advantages over traditional hardness testing. First, the contact area can be analytically inferred and does not have to be optically measured. Second, the displacements measured during unloading manifest elastic recovery, and thus are a means for deriving Young’s modulus by means of previously developed elastic contact models.
Topic:
Indentation University Session 5: The Onset of Plasticity in Indentation - Presented in Chinese-20130313 0203-1
Recording date:
Tuesday, March 12, 2013 10:03 pm
Eastern Daylight Time (New York, GMT-04:00)
Panelist Information:
Cun-yi Xie, Ph.D., Keysight Technologies, Inc.
Duration:
56 minutes
Description:
Design and analysis of instrumented indentation experiments require knowing the threshold and locus for the onset of plasticity. In this session, we use the Tresca criterion to understand the onset of plasticity for both Hertzian and conical indentation. For Hertzian indentation, the onset of plasticity depends on applied load, indenter geometry, and material properties. Because conical indentation is self-similar, the onset of plasticity depends only on indenter geometry and material propertes, not applied load.
Topic:
Indentation University, Session 2: Elastic Contact Mechanics - Presented in Chinese -20121024 0203-1
Recording date:
Tuesday, October 23, 2012 10:00 pm
Eastern Daylight Time (New York, GMT-04:00)
Panelist Information:
Cun-yi Xie, Ph.D., Keysight Technologies, Inc.
Duration:
53 minutes
Description:
Force and displacement measurements obtained from instrumented indentation experiments are interpreted using elastic contact models, even when the contact causes plastic deformation. Elastic contact models specify the ideal relationship between force, displacement, and elastic properties. Such models are explained in this presentation. Ian Sneddon’s elastic contact model is given special attention due to its generality, and the models of Hertz and Love are shown to be special cases of Sneddon’s model. Many examples are provided which show how to apply Sneddon’s model to specific geometries of contacting bodies.
Topic:
Indentation University, Session 3: Sneddon Revisited - Presented in Chinese-20121107 0204-1
Recording date:
Tuesday, November 6, 2012 9:00 pm
Eastern Standard Time (New York, GMT-05:00)
Panelist Information:
Cunyi Xie, Ph.D., Keysight Technologies, Inc.
Duration:
47 minutes
Description:
Sneddon’s ideal relationship between force, displacement, and elastic properties is not entirely adequate for the analysis of indentation experiments, because the boundary conditions of Sneddon’s theory allow for inward radial displacements which do not occur during an indentation experiment. In a 1999 publication, Jack Hay, Alexei Bolshakov, and George Pharr identified and solved this problem; their solution is frequently employed (200+ citations). The solution provided by Hay, Bolshakov, and Pharr may be generalized so as to apply to all contacting geometries governed by Sneddon’s theory.
Topic:
Indentation University, Session 3: Sneddon Revisited-20121107 1608-1
Recording date:
Wednesday, November 7, 2012 11:00 am
Eastern Standard Time (New York, GMT-05:00)
Panelist Information:
Jennifer Hay, Keysight Technologies, Inc.
Duration:
46 minutes
Description:
Sneddon’s ideal relationship between force, displacement, and elastic properties is not entirely adequate for the analysis of indentation experiments, because the boundary conditions of Sneddon’s theory allow for inward radial displacements which do not occur during an indentation experiment. In a 1999 publication, Jack Hay, Alexei Bolshakov, and George Pharr identified and solved this problem; their solution is frequently employed (200+ citations). The solution provided by Hay, Bolshakov, and Pharr may be generalized so as to apply to all contacting geometries governed by Sneddon’s theory.
Topic:
Indentation University, Session 4 - A General Modification to Sneddon's Force-Displacement - Presented in Chines-20130109 0202-1
Recording date:
Tuesday, January 8, 2013 9:00 pm
Eastern Standard Time (New York, GMT-05:00)
Panelist Information:
Cun-yi Xie, Ph.D., Keysight Technologies, Inc.
Duration:
39 minutes
Description:
In a 1999 publication, Jack Hay, Alexei Bolshakov, and George Pharr proposed that a factor, gamma, should modify Sneddon's force-displacement relation for a cone. Similar analysis for Hertzian contacts leads to a general expression for gamma that is appropriate for any axisymmetric punch that is smooth at the edge of contact.
Topic:
Low Voltage Field Emission Scanning Electron Microscopy for Graphene Films-20120926 1503-1
Recording date:
Wednesday, September 26, 2012 11:00 am
Eastern Daylight Time (New York, GMT-04:00)
Panelist Information:
Jining Xie, Ph.D., Keysight Technologies
Duration:
1 hour 3 minutes
Description:
Scanning electron microscopy is gaining popularity for imaging graphene because it is a rapid, non-invasive, and effective technique that is complementary to most others. However, SEM imaging of graphene is difficult, owing primarily to the intrinsic properties of graphene films. Imaging graphene with a low-beam-voltage FE-SEM is very promising due to this technique’s unique combination of high resolution, small beam/specimen interaction volume, enhanced contrast, and ability to reveal more surface detail. In this seminar, high-resolution imaging of different graphene films with a compact Agilent 8500 FE-SEM will be presented. Surface morphologies of graphene films can be revealed via the use of multiple imaging modes, such as secondary electron imaging, backscattering electron imaging, and topographic imaging. The effects of electron beam voltage and underlying substrates on graphene imaging will be discussed. Attempts will also be made to discuss possible contrast mechanisms involved in graphene imaging.
Topic:
Low-Voltage FE-SEM for Graphene Films - Presented in Chinese-20120925 0204-1
Recording date:
Monday, September 24, 2012 10:00 pm
Eastern Daylight Time (New York, GMT-04:00)
Panelist Information:
Jining Xie, Ph.D., Keysight Technologies
Duration:
53 minutes
Description:
Scanning electron microscopy is gaining popularity for imaging graphene because it is a rapid, non-invasive, and effective technique that is complementary to most others. However, SEM imaging of graphene is difficult, owing primarily to the intrinsic properties of graphene films. Imaging graphene with a low-beam-voltage FE-SEM is very promising due to this technique’s unique combination of high resolution, small beam/specimen interaction volume, enhanced contrast, and ability to reveal more surface detail. In this seminar, high-resolution imaging of different graphene films with a compact Agilent 8500 FE-SEM will be presented. Surface morphologies of graphene films can be revealed via the use of multiple imaging modes, such as secondary electron imaging, backscattering electron imaging, and topographic imaging. The effects of electron beam voltage and underlying substrates on graphene imaging will be discussed. Attempts will also be made to discuss possible contrast mechanisms involved in graphene imaging.
Topic:
Mechanical Testing of Nanofibers: Novel Methods and Research AND Multifunctional Composite Nanofibers -20121009 1503-1
Recording date:
Tuesday, October 9, 2012 11:00 am
Eastern Daylight Time (New York, GMT-04:00)
Panelist Information:
Frank Ko, Ph.D., University of British Columbia, Sandip Basu, Ph.D., Keysight Technologies
Duration:
56 minutes
Description:
Topic 1 Multifunctional Composite Nanofibers Frank Ko, Ph.D., University of British Columbia

The processing, structure, and properties of nanocomposite fibrils consisting of various nanofillers will be presented. The implication of the availability of these nanostructured materials and their translation into higher-order structures for various advanced applications will also be discussed. In the work detailed here, nanoparticles were incorporated in a nanofiber to form nanocomposite fibrils and yarns. This was carried out by a co-electrospinning process wherein nanocomposite fibrils were spun from a spinning dope consisting of a mixture of nanoparticles and polymer solution. The thermal, mechanical, biological, electrical, optical, and magnetic properties of these nanocomposite systems were characterized. The multiphase fibrils and fibrillar assemblies not only manifest the nanoscale effects inherent to the individual nanocomponents but also facilitate processing and translation of the nanoscale effects to macroscopic structures.

Topic 2: Mechanical Deformation of Small-Diameter Electrospun PCL Fibers Sandip Basu, Ph.D. Keysight Technologies

Understanding the mechanical behavior of fibers is important for their applications in biomedical scaffolds, composite materials, textiles, etc. This is especially true for nanofibers and microfibers, where the properties can be significantly different from their bulk counterparts. In this work, a novel test instrument and method are utilized to measure tensile properties of small-diameter electrospun polycaprolactone (PCL) fibers. A novel experimental concept, continuous dynamic analysis (CDA), is also discussed. It enables the measurement of storage and loss modulus of thin fibers as a continuous function of strain. CDA has been used to characterize tensile deformation behavior of individual filaments of spider silk as well as other technologically important fibers.
Topic:
Nanoscale Graphene Studies using AFM and FE-SEM-20130502 1504-2
Recording date:
Thursday, May 2, 2013 11:04 am
Eastern Daylight Time (New York, GMT-04:00)
Panelist Information:
Jining Xie, PhD, Keysight Technologies; Jing-Jiang Yu, Ph.D, Keysight Technologies
Duration:
1 hour 11 minutes
Description:
Topic #1 - Contrast Mechanism Study of Imaging CVD-derived Graphene Films via Low Voltage Field Emission Scanning Electron Microscopy Presenter: Jining Xie, PhD

Scanning electron microscopy (SEM) is becoming more popular for imaging graphene because it is a rapid, non-invasive and effective imaging technique which is complimentary to most others. However, SEM imaging of graphene is difficult mainly because of the intrinsic properties of graphene films. Imaging graphene with a low beam voltage field emission SEM (FE-SEM) is very promising due to its unique combination of high resolution, a small beam/specimen interaction volume, enhanced contrasts and the capability of revealing more surface details. In this seminar, high resolution imaging of different graphene films using an Agilent 8500 compact FE-SEM will be presented. Surface morphologies of graphene films can be revealed with multiple imaging modes such as secondary electron imaging, backscattering electron imaging and topographic imaging. The effect of electron beam voltage on graphene imaging will be studied. Discussions will be also made on possible contrast mechanisms involved in low voltage graphene imaging.

Topic #2 - Advances in Atomic Force Microscopy for Enhanced Sensing of Graphene-related Nanomaterials Jing-jiang Yu, PhD

Atomic force microscopy (AFM) has established itself as a powerful surface characterization tool in nanoscience and nanotechnology. In this presentation, new development of advanced AFM imaging strategies such as single-pass Kelvin force microcopy and capacitance gradient dC/dZ measurements that has expanded the breadth of what is measurable in material sciences will be introduced, and their applications on graphene will reveal previously unseen results. Since graphene and its derivatives have attracted tremendous attention recently due to their exotic electronic properties, using exfoliated single-layer and few-layer graphene films as examples, the ultrahigh detection sensitivity associated with single-pass KFM and dC/dZ imaging will be demonstrated and the effect of film thickness on their surface potentials is observed. In contrast to KFM studies, the dC/dZ measurements indicate that the local dielectric permittivity of few-layer graphene films maintains at the same level regardless of the film thickness. Such simultaneous monitoring of multiple electronic properties that exhibit different behaviors in response to the graphene layers provides us a technique to achieve both a comprehensive characterization and a better understanding of graphene materials. In addition, our new results on investigations of white graphene (Boron Nitride) and graphene oxide using other AFM-based techniques such as current-sensing AFM (CS-AFM) or electric force microscopy (EFM) will be reviewed.
Topic:
Sample Preparation for Atomic Force Microscopy, Part I - Presented in Chinese-20120918 0206-1
Recording date:
Monday, September 17, 2012 10:00 pm
Eastern Daylight Time (New York, GMT-04:00)
Panelist Information:
Song Xu, Ph.D., Keysight Technologies, Inc.
Duration:
1 hour 4 minutes
Description:
In this seminar, we will discuss sample preparation for atomic force microscopy. Several years ago, we touched upon this topic in a shorter seminar that dealt with the basic principles of preparing samples for AFM imaging. This time, we will delve into greater detail and present more examples. We will start with a discussion of very commonly used substrates that are ideal for immobilizing AFM samples. Then we will consider techniques for cleaning various samples and substrates. For biological applications, we will emphasize how to immobilize samples such as bacteria, DNA, and proteins for stable imaging, both in air and in water. We will also discuss the handling and fixing of samples for special applications, such as in situ high/low-temperature imaging.
Topic:
Sample Preparation for Atomic Force Microscopy, Part I-20120919 1505-1
Recording date:
Wednesday, September 19, 2012 11:00 am
Eastern Daylight Time (New York, GMT-04:00)
Panelist Information:
Song Xu, Ph.D., Keysight Technologies, Inc.
Duration:
1 hour 7 minutes
Description:
In this seminar, we will discuss sample preparation for atomic force microscopy. Several years ago, we touched upon this topic in a shorter seminar that dealt with the basic principles of preparing samples for AFM imaging. This time, we will delve into greater detail and present more examples. We will start with a discussion of very commonly used substrates that are ideal for immobilizing AFM samples. Then we will consider techniques for cleaning various samples and substrates. For biological applications, we will emphasize how to immobilize samples such as bacteria, DNA, and proteins for stable imaging, both in air and in water. We will also discuss the handling and fixing of samples for special applications, such as in situ high/low-temperature imaging.
Topic:
Sample Preparation for Atomic Force Microscopy, Part II - Presented in Chinese-20121030 0204-1
Recording date:
Monday, October 29, 2012 10:00 pm
Eastern Daylight Time (New York, GMT-04:00)
Panelist Information:
Song Xu, Ph.D., Keysight Technologies, Inc.
Duration:
50 minutes
Description:
In this seminar, we will continue to discuss sample preparation for AFM imaging. This time, we will cover the details of preparation for a list of very popular samples, including nanoparticles, Au(111) surfaces, graphene, block co-polymers, self-assembled monolayers, and lipid bilayers. Registrants are encouraged to send us suggestions regarding additional sample preparations you would like us to discuss, and we will try our best to include them in this seminar.
Topic:
Sample Preparation for Atomic Force Microscopy, Part II-20121031 1504-1
Recording date:
Wednesday, October 31, 2012 11:00 am
Eastern Daylight Time (New York, GMT-04:00)
Panelist Information:
Song Xu, Ph.D., Keysight Technologies, Inc.
Duration:
1 hour 6 minutes
Description:
In this seminar, we will continue to discuss sample preparation for AFM imaging. This time, we will cover the details of preparation for a list of very popular samples, including nanoparticles, Au(111) surfaces, graphene, block co-polymers, self-assembled monolayers, and lipid bilayers. Registrants are encouraged to send us suggestions regarding additional sample preparations you would like us to discuss, and we will try our best to include them in this seminar.
Topic:
Session I–General Introduction-20110510 1203-1
Recording date:
Tuesday, May 10, 2011 8:00 am
Eastern Daylight Time (New York, GMT-04:00)
Panelist Information:
Holger Pfaff, Applications Scientist, Keysight Technologies, Inc.
Duration:
1 hour 9 minutes
Description:
Topic 1: “Testing the Tiny”
A Walk Through Nanomechanics and an Introduction to Nanoindentation

Progressive miniaturization has led to a growing need to determine the physical properties of microscopic volumes of materials. Nanoindentation has become a valuable method for testing the mechanical properties of thin films, MEMS devices, and other materials at both the micro- and nanoscales. We will introduce a selection of recent research topics in the field and provide an overview of the most important approaches, methodologies, and tools used to address some of the associated challenges.

Topic 2: “All the Things You Can Do”
Advanced Applications Beyond Nanoindentation

Originally developed for the determination of Young’s modulus and hardness of materials, nanoindentation methodologies and tools have been extended to characterize various material properties like adhesion, fracture, creep, scratch, and wear. Some of these applications will be introduced and discussed in more detail.
Topic:
Session II–Pressing the Right Buttons_Practical Use of the Agilent Nano Indenter-20110524 1211-1
Recording date:
Tuesday, May 24, 2011 8:00 am
Eastern Daylight Time (New York, GMT-04:00)
Panelist Information:
Holger Pfaff, Applications Scientist, Keysight Technologies, Inc.
Duration:
51 minutes
Description:
“Pressing the Right Buttons”
Getting Familiar with the NanoSuite Testing Environment

Keysight NanoSuite software is a powerful tool for defining and controlling mechanical tests, analyzing data, and achieving significant automation of your experiments. It can be utilized by users who range from operator to expert level. Although most of the functions are very intuitive, we will give an overview of NanoSuite features aimed at allowing you to make your testing more efficient and to get the most out of your work. We will also give an introduction to writing your own test procedures for custom-tailored applications.
Topic:
Session III–Looking for Results - Data Analysis, Post Processing
Recording date:
Tuesday, May 31, 2011 8:00 am
Eastern Daylight Time (New York, GMT-04:00)
Panelist Information:
Holger Pfaff, Applications Scientist, Keysight Technologies, Inc.
Duration:
48 minutes
Description:
“Looking at the Results”
Data Analysis and Post-Processing

Data analysis is as important to solid research as the experiments themselves. We will show you how to take a closer look at your data, generate overview diagrams, calibrate your tip area function, and extract additional information from your basic data. We will also address the post-processing of imaging data acquired with either the Agilent NanoVision or Keysight Survey Scan option.
Topic:
The 60-Minute T150 Primer: System Theory, Applications & Case Studies-20120524 1503-1
Recording date:
Thursday, May 24, 2012 11:00 am
Eastern Daylight Time (New York, GMT-04:00)
Panelist Information:
Warren Oliver, Ph.D., Nanomechanics, Inc.; Sandip Basu, Ph.D., Keysight Technologies, Inc.
Duration:
54 minutes
Description:
Topic #1 - What is it? How does it work? What makes it unique? The Agilent T150 Mechanical Testing System
Presenter: Warren C. Oliver, PhD Nanomechanics

The Agilent T150 is a uniaxial mechanical testing system that has some unique capabilities. It owes those unique capabilities to a very different type of load cell than one typically encounters in the mechanical testing field of research. The system combines viscoelastic characterization at the nanometer scale of motion with very large extension capabilities. The system is rigid at low frequencies, which allows careful control of macroscopic extension sequences. At higher frequencies the system displays a very low stiffness. This allows frequency specific viscoelastic characterization of compliant samples to be accomplished. One of the really interesting aspects of this system is that these characteristics can be used to simultaneously measure the change in strength, modulus and damping that occurs in materials as large strains are slowly applied to it. The theory of the system and a number of applications will be discussed.

Topic #2 - Quasi-static And Dynamic Tensile Behavior of Small-Diameter Individual Fibers
Presenter: Sandip Basu, PhD Keysight Technologies

Small-diameter individual fibers are gaining interest for various applications in structural composites, textile and biomedical tissue engineering. However, it has been a challenging problem to test small-diameter fibers in tension because of their low compliance – either due to low modulus of the material or due to very small diameter. In this presentation, we discuss two case studies. First, the effect of diameter on the quasi-static mechanical deformation of electro spun polycaprolactone (PCL) fibers. Despite the low compliance, the engineering stress-strain curves demonstrate the increasing trend of Young’s modulus and tensile strength with decreasing fiber diameter. Second, the continuous dynamic analysis on individual polyethylene terephthalate (PET) fibers, where the storage and loss modulus were measured continuously during a tensile test. The effect of strain on morphological changes, and in turn on mechanical properties, will open up new research directions towards better design and reliability of polymer structures.
Topic:
Understand the Basics of Imaging Modes and the Physics of Imaging Parameters-20130328 1504-1
Recording date:
Thursday, March 28, 2013 11:04 am
Eastern Daylight Time (New York, GMT-04:00)
Panelist Information:
Song Xu, Applications Scientist, Keysight Technologies, Inc.
Duration:
1 hour 13 minutes
Description:
This seminar is continuation of our earlier seminars about the physics of AFM imaging. During my past years of experience training AFM users, I am often asked questions such as : How do I optimize the feedback? What should I do to reduce noise? How do I improve resolution? What kind of parameter should I use for certain samples? Etc. Instead of answering such “how to” questions directly, I found myself describing the basic principles of how an AFM works. I believe a very clear understanding of the physics and mathematical models of the AFM working principle is the key to the answers for many of these questions. In previous on line seminars, we have covered the topics like AFM imaging modes, imaging parameters and techniques of imaging optimization as well as sample preparation. In this seminar, we will discuss in more details the physics and mathematics behind the basic AFM hardware, software, feedback working mechanism and parameters and the fundamentals in AFM design, electronics, material construction.
Topic:
原子力显微镜技术的新进展在石墨烯及其相关纳米材料表佂中的应用 / 低电压场发射扫描电子显微镜技术在观察石墨烯样品中的应用-20130320 0204-1
Recording date:
Tuesday, March 19, 2013 10:04 pm
Eastern Daylight Time (New York, GMT-04:00)
Panelist Information:
Jing Jiang Yu PhD, Keysight Technologies, Inc. & Jining Xie PhD, Keysight Technologies , Inc.
Duration:
1 hour 7 minutes
Description:
原子力显微镜技术的新进展在石墨烯及其相关纳米材料表佂中的应用 Jing Jiang Yu PhD, Keysight Technologies, Inc.

作为一种强大的材料表面特性表佂工具,原子力显微镜(AFM)已经在过去的20年里确立了自己在纳米科学和纳米技术领域的不可取代地位。鉴于石墨烯及其衍生物由于他们奇特的电子特性最近以来备受关注,本报告将对安捷伦针对进一步扩展材料测量科学领域的广度而研究开发的集单次、多通道、高精度电学性能扫描等特点于一体的髙级原子力显微镜成像模式,即单次开尔文力显微镜和电容梯度dC/dZ测量原理以及该技术在增强石墨烯及其相关纳米材料表佂中的应用做一详细介绍。用采用机械裂解脱落的方法制备的单层或多层石墨烯薄膜作为实例,有关单次开尔文力显微镜和电容梯度dC/dZ测量技术的超高的检测灵敏度将被完全展示。与此同时,石墨烯层数或薄膜厚度被证明对多层石墨烯体系的表面电位有着关键性的影响。与观察和捕捉到的表面电位趋势相反,dC/dZ测量表明多层石墨烯薄膜的局部介电常数保持在相同的水平,而不受薄膜厚度的影响。由此可见,单次开尔文力显微镜和电容梯度dC/dZ测量成像模式为我们提供了一种可以对基于石墨烯层数表现出不同响应的多种物质电子特性实施同时监测的手段,以实现对石墨烯及其相关纳米材料有一个全面系 统的表佂和更好地了解。此外,一些我们近期展开的使用其他原子力显微镜成像模式,例如电流检测原子力显微镜(CS-AFM)或静电力显微镜(EFM)技术,对白石墨烯(氮化硼)和氧化石墨烯等新兴材料的电学特性的研究新结果将被展示。



低电压场发射扫描电子显微镜技术在观察石墨烯样品中的应用 Jining Xie PhD, Agilent Technologies

作为一种快速而且高效的微观成像技术,扫描电子显微镜正在广泛地应用于越来越多的领域,例如材料科学,生物科学,半导体工业以及纳米技术。但是,用扫描电子显微镜来观察石墨烯样品的表面形貌并不是很容易。这主要是因为石墨烯样品本身的特点,比如超薄,纳米级形貌以及不导电衬底等等。低电压场发射扫描电子显微镜成像技术具有高分辨率成像和成像中显著减小的电子束/样品相互作用体积的特点,其成像显示出增强的衬度并且能够更突出样品的表面特征。在这次讲座中,我们将结合安捷伦台式低电压场发射扫描电子显微镜来讨论这种显微镜成像技术在观察石墨烯样品的应用。同时我们还会对石墨烯成像中观察到的衬度机理做些尝试性的探讨以供大家参考。
Topic:
标题:原子力显微镜基本物理原理讲座-20130328 0204-1
Recording date:
Wednesday, March 27, 2013 10:04 pm
Eastern Daylight Time (New York, GMT-04:00)
Panelist Information:
Song Xu, Applications Scientist, Keysight Technologies, Inc.
Duration:
59 minutes
Description:
这次讲座是原子力显微镜基本原理讲座系列之一。在过去的历次讲座中,我们形象地讨论了有关原子力显微镜基本成像模式,基本参数的优化以及样品制备和针尖挑选的有关问题。虽然对原子力显微镜这个很复杂的仪器做感性上讨论比较容易被很快理解和接受, 但这样的描述缺乏严格清晰的数学和物理定义。而这次讲座,我们将就原子力显微镜成像原理,仪器电路反馈基础,设计制造材料,工作参数作更深入的物理基础和数学模型讨论。我认为,对仪器的数理模型原理的熟悉是一个应用原子力显微镜来做研究的科学家必修课,对于日常使用和仪器优化是很有帮助的。
Topic:
Indentation University, Session 2: Elastic Contact Mechanics -20121003 1504-1
Recording date:
Wednesday, October 3, 2012 11:00 am
Eastern Daylight Time (New York, GMT-04:00)
Panelist Information:
Jennifer Hay, Keysight Technologies, Inc.
Duration:
1 hour 3 minutes
Description:
Force and displacement measurements obtained from instrumented indentation experiments are interpreted using elastic contact models, even when the contact causes plastic deformation. Elastic contact models specify the ideal relationship between force, displacement, and elastic properties. Such models are explained in this presentation. Ian Sneddon’s elastic contact model is given special attention due to its generality, and the models of Hertz and Love are shown to be special cases of Sneddon’s model. Many examples are provided which show how to apply Sneddon’s model to specific geometries of contacting bodies.
Topic:
Indentation University - Session 7: Dynamic Instrumented Indentation-20130410 1503-1
Recording date:
Wednesday, April 10, 2013 11:03 am
Eastern Daylight Time (New York, GMT-04:00)
Panelist Information:
Jennifer Hay, Factory Applications Scientist, Keysight Technologies, Inc.
Duration:
1 hour 2 minutes
Description:
During basic instrumented indentation (IIT), contact force and penetration are measured continuously as a hard indenter is pressed into contact with, and then withdrawn from, a test material. Dynamic instrumented indentation also involves pressing an indenter into contact with a test material while continuously measuring contact force and penetration. But in addition, a small oscillation is superimposed on the semi-static force, and a frequency-specific amplifier is used to measure the response of the indenter. From the amplitude quotient and phase shift, one derives both the stiffness and damping of the contact. This additional dynamic information affords a number of advantages over basic IIT, the most common of which is the ability to measure hardness and elastic modulus as a continuous function of surface penetration.
Topic:
Exciting New Nano Indenter G200 Capability-20120329 1502-1
Recording date:
Panelist Information:
Warren Oliver, Ph.D., Nanomechanics, Inc.; Jennifer Hay, Keysight Technologies, Inc.
Duration:
1 hour
Description:
Topic #1 - True Mechanical Properties Mapping Presenter: Warren Oliver, NMI Obtaining surface maps of elastic modulus and hardness has been a persistent goal of the nanoindentation community. One proffered solution is to infer properties from an AFM-like scan of the surface. This technique has subtle but significant limitations. Even under optimal conditions, the technique can only be used to determine elastic modulus, not hardness. Further, surface roughness and incipient plasticity compromise the determination of contact area and thus elastic modulus. The conditions under which these problems manifest themselves will be demonstrated with practical examples. Finally, a new technique is introduced that yields highly resolved surface maps of elastic modulus and hardness by means of ultra-fast, but otherwise traditional, nanoindentation.

Topic #2 - Revolutionary New Technique in Action Presenter: Jennifer Hay, Keysight Technologies, Inc. Keysight will present a revolutionary new way of quickly evaluating surface mechanical properties. This technique implements the best of traditional indentation equipment, test protocol, and analysis. We will show results on a wide variety of materials, including polycarbonate, Pyrex, silicon, nickel, and sapphire. In addition, the new technique will be utilized to map the mechanical properties of 2205 duplex stainless steel. The ferrite grains clearly manifest a higher hardness than austenite grains, but the elastic modulus is surprisingly uniform.
Topic:
Understand Imaging Force, Energy Dissipation and Phase in AC Mode-20130418 1502-1
Recording date:
Thursday, April 18, 2013 11:02 am
Eastern Daylight Time (New York, GMT-04:00)
Panelist Information:
Song Xu, Applications Scientist, Keysight Technologies, Inc.
Duration:
1 hour 10 minutes
Description:
In order to obtain good results, high resolution images, clear contrasted picture of a sample, an AFM operator has to spend time on optimizing “force” between the tip and sample. In this seminar, we will discuss the basics of the physics and mathematics to determine actual force between the tip and sample in contact mode, AC mode, in air and in liquid, and how to optimize the imaging mode and force to achieve high resolution of different samples. Phase imaging is a very unique imaging channel obtained during AC mode image, in the second part of this seminar, we will also discuss the physics of phase imaging, and how to use this unique AFM imaging channel to obtain information.
Topic:
标题:原子力显微镜基本原理:成像力优化,相位移图的基本认识-20130424 0203-1
Recording date:
Tuesday, April 23, 2013 10:03 pm
Eastern Daylight Time (New York, GMT-04:00)
Panelist Information:
Song Xu, Applications Scientist, Keysight Technologies, Inc.
Duration:
1 hour 3 minutes
Description:
许多原子力显微镜操作者都有这样的体会,不管用何种成像模式,我们必须对成像力的大小做适当的优化,才能得到清晰的成像。这次讲座,我们会从物理和数学模型入手,就如何估算和优化成像力进行讨论。原子力显微镜相图是一种独特的显微成像技术,这次讲座,我们还将比较深入地讨论相图的基本原理以及如何利用相图来认识样品的物理性质。
Topic:
Indentation University - Session 8: Statistical Analysis of Measurements-20130508 1502-1
Recording date:
Wednesday, May 8, 2013 11:02 am
Eastern Daylight Time (New York, GMT-04:00)
Panelist Information:
Jennifer Hay, Factory Applications Scientist, Keysight Technologies, Inc.
Duration:
55 minutes
Description:
How different do two measurements have to be in order for the difference to be statistically significant? This question is certainly not unique to instrumented indentation testing, but the means for answering must be available to practitioners of instrumented indentation. In this session, we review the student’s t-test for assessing significant difference in observation sets and its implications for experimental design.
Topic:
Indentation University - Session 7: Dynamic Instrumented Indentation - Presented in Chinese-20130515 0205-1
Recording date:
Tuesday, May 14, 2013 10:05 pm
Eastern Daylight Time (New York, GMT-04:00)
Panelist Information:
Cun-yi Xie, Ph.D., Keysight Technologies, Inc.
Duration:
50 minutes
Description:
During basic instrumented indentation (IIT), contact force and penetration are measured continuously as a hard indenter is pressed into contact with, and then withdrawn from, a test material. Dynamic instrumented indentation also involves pressing an indenter into contact with a test material while continuously measuring contact force and penetration. But in addition, a small oscillation is superimposed on the semi-static force, and a frequency-specific amplifier is used to measure the response of the indenter. From the amplitude quotient and phase shift, one derives both the stiffness and damping of the contact. This additional dynamic information affords a number of advantages over basic IIT, the most common of which is the ability to measure hardness and elastic modulus as a continuous function of surface penetration.
Topic:
Indentation University Session 9: Theory of Indentation Creep-20130612 1502-1
Recording date:
Wednesday, June 12, 2013 11:02 am
Eastern Daylight Time (New York, GMT-04:00)
Panelist Information:
Jennifer Hay, Factory Applications Scientist, Keysight Technologies, Inc.
Duration:
1 hour 3 minutes
Description:
In addition to hardness and Young’s modulus, instrumented indentation can be used to characterize creep in metals. This is because hardness is a manifestation of the yield stress of the metal. Under conditions of creep, the yield stress depends on temperature and strain rate. As a manifestation of yield stress, hardness is not a constant, but instead depends on temperature and strain rate just as yield stress does. By quantifying these dependencies, instrumented indentation can be used to determine the stress exponent and activation energy for creep.
Topic:
Indentation University - Session 8: Statistical Analysis of Measurements - Presented in Chinese-20130619 0203-1
Recording date:
Tuesday, June 18, 2013 10:03 pm
Eastern Daylight Time (New York, GMT-04:00)
Panelist Information:
Cun-yi Xie, Ph.D., Keysight Technologies
Duration:
51 minutes
Description:
How different do two measurements have to be in order for the difference to be statistically significant? This question is certainly not unique to instrumented indentation testing, but the means for answering must be available to practitioners of instrumented indentation. In this session, we review the student’s t-test for assessing significant difference in observation sets and its implications for experimental design.
Topic:
Indentation University Session 10: In Situ Young's Modulus and Strain-Rate Sensitivity of Lead-Free SAC 105 Sold-20130710 1505-1
Recording date:
Wednesday, July 10, 2013 11:05 am
Eastern Daylight Time (New York, GMT-04:00)
Panelist Information:
Jennifer Hay, Factory Applications Scientist, Keysight Technologies, Inc.with Dr. Carlos Morillo of CALCE
Duration:
44 minutes
Description:
Motivated by our desire to understand and improve the mechanical reliability of solder joints in integrated circuits, we used instrumented indentation to measure the Young's modulus (E ) and strain-rate sensitivity (m) of a common lead-free solder alloy, SAC 105 (98.5% Sn, 1% Ag, 0.5% Cu). Measured values (E = 49.1±1.6GPa, m = 0.184±0.013) were remarkably close to what others have measured for unalloyed Sn by means of uniaxial tension and compression experiments, thus lending credibility to the indentation method.
Topic:
压痕大学:第九讲报告主题:压痕蠕变理论-20130918 0202-1
Recording date:
Tuesday, September 17, 2013 10:02 pm
Eastern Daylight Time (New York, GMT-04:00)
Panelist Information:
Cun-yi Xie, Ph.D., Keysight Technologies, Inc.
Duration:
58 minutes
Description:
除了硬度和杨氏模量测试,仪器化压痕技术还可用于金属材料的蠕变表征。这是因为硬度是金属的屈服应力的一种表现。在蠕变条件下,屈服应力依赖于温度和应变速率。作为屈服应力的一种表现,硬度不是一个常数,而是依赖于温度和应变速率。通过量化这些依赖关系,仪器化压痕测试可以被用来测量蠕变应力指数和激活能
Topic:
Session 11: Complex Young’s Modulus of Viscoelastic Polymers -20131009 1502-1
Recording date:
Wednesday, October 9, 2013 11:02 am
Eastern Daylight Time (New York, GMT-04:00)
Panelist Information:
Jennifer Hay, Factory Application Scientist, Keysight Technologies, Inc.
Duration:
1 hour 1 minute
Description:
Polymers are exceptionally complex materials. The mechanical properties of polymers depend on the type and length of the parent chain, branching, cross-linking, strain, temperature, and frequency, and these dependencies are generally interrelated. Further, it is likely that mechanical properties also depend on volume constraints. Thus, in order to gain useful information for making sound decisions when designing with polymers, mechanical property measurements should be made on a relevant sample in a relevant context. Instrumented indentation testing makes such context-specific measurements more accessible, because samples can be small and minimally prepared. On bulk materials, values for storage and loss modulus measured by indentation agree well with values measured by dynamic mechanical analysis.
Topic:
A Calibration Algorithm for Nearfield Scanning Microwave Microscopes; Scanning Microwave Microscopy-20131014 1406-1
Recording date:
Monday, October 14, 2013 10:06 am
Eastern Daylight Time (New York, GMT-04:00)
Panelist Information:
Dr. Johannes Hoffmann, PhD, METAS; Ferry Kienberger, PhD Agilent Research Labs, Austria
Duration:
57 minutes
Description:
Presentation #1 - Dr. Johannes Hoffmann, PhD Swiss Institute of Technology

This talk presents a new algorithm for the calibration of nearfield scanning microwave microscopes. By adopting techniques known from vector network analyzer calibration, a nearfield scanning microwave microscope can be calibrated at a specific microwave frequency with three standards. The advantages compared to existing calibration methods are that the calibration is valid for all possible samples and that the measurements require less time than other algorithms.

Presentation #2 -Ferry Kienberger, PhD Agilent Research Labs, Austria

Scanning microwave microscopy (SMM) is a recent development in nanoscale imaging technique that combines the lateral resolution of atomic force microscopy (AFM) with the high measurement precision of microwave analysis at GHz frequencies. It consists of an AFM interfaced with a vector network analyzer (VNA). Here we present the basic working principles of SMM and advanced applications. In particular, calibrated capacitance and resistance measurements are shown with a noise level of 1 aF . Calibrated dopant profiles are measured from 10E14 to 10E20 atoms/cm3 for nano-electronics characterization ]. Pointwise C-V (capacitance-voltage) spectroscopy curves were acquired allowing for the characterization of oxide quality, interface traps, and memory effects of novel materials.
Topic:
压痕大学:第十讲- 报告主题: 无铅焊料SAC105 的原位杨氏模量和应变速率敏感因子测试-20131023 0204-1
Recording date:
Tuesday, October 22, 2013 10:04 pm
Eastern Daylight Time (New York, GMT-04:00)
Panelist Information:
Cun-yi Xie, Ph.D., Keysight Technologies, Inc.
Duration:
42 minutes
Description:
为了理解和提高集成电路焊点的机械可靠性,我们利用仪器化压痕测量技术测量了一个常见的无铅焊料合金,SAC105(锡98.5%,1%的Ag,0.5%铜)的杨氏模量(E)和应变率敏感因子(m)。压痕测量值(E=49.1±1.6GPa,m=0.184±0.013)非常接近通过单轴拉伸和压缩实验对非合金锡的测量值,这从一个侧面确认了纳米压痕测试测量方法的可信度。
Topic:
In-situ Imaging and Mechanical Property Study of Lithium Ion Battery Using AFM in a Low Oxygen, Low Moisture Env-20131029 1409-1
Recording date:
Tuesday, October 29, 2013 10:09 am
Eastern Daylight Time (New York, GMT-04:00)
Panelist Information:
Song Xu, Ph.D., Keysight Technologies, Inc.
Duration:
46 minutes
Description:
Lithium battery research attract wide interest among researchers recently. To understand the fundamentals of battery performance, it is important to observe the formation and property of SEI in-situ in an EC cell setting. It is also known that the in-situ AFM observation of the SEI in an EC cell has many difficulties. Lithium metal and the electrolyte used in Lithium battery is very sensitive to environmental factors, such as oxygen and moisture. Installing an AFM inside a low oxygen and low moisture glove box creates further challenges. A simple operation in a normal laboratory setting becomes difficult when attempted in a glove box. In this seminar, we will analyze the scientific and technical difficulties of such experiment, such as vibration isolation inside a glove box; modified EC cell for easy to install Lithium electrodes, the necessary modification to make the experiment easy to perform with the gloves on. We will also demonstrate data that reveals the formation and evolution of the SEI on HOPG and other electrode materials. Extended CV and in-situ AFM imaging show that the formation of SEI is not a single layer growth. The SEI initially form on the surface of HOPG form a single layer, as we ramp down the CV potential, the single layer becomes two layers, with observable delamination happening between them. Mechanical property of the SEI is studied using AFM tip based nano-indentation and data will be analyzed using a plug-in software to obtain the mechanical mapping and evolution of the SEI.
Topic:
原子力显微镜在锂电池研究领域的问题和进展-20131030 0208-1
Recording date:
Tuesday, October 29, 2013 10:08 pm
Eastern Daylight Time (New York, GMT-04:00)
Panelist Information:
Song Xu, Ph.D., Keysight Technologies, Inc.
Duration:
53 minutes
Description:
电池电极表面电解质界面层(Surface Electrolyte Interface, or SEI)的形成和演化是影响充电电池性能和使用寿命的最大因素。 用原子力显微镜来原位观察电池电极表面电解质界面是研究和了解电池充放电基础研究的最有效的手段。近年来,锂电池的研究发展迅速。但是金属锂是对氧气和水蒸汽分子很敏感的活泼金属。用原子力显微镜电化学池在无氧气和无水蒸汽的环境下来观察锂电池的化学反应会面对一系列很具体操作的难题。这次讲座,我们将讨论这些具体的难题,以及解决的方法。我们还会展示一些实验结果以及讨论几个可能的未来实验发展方向。
Topic:
Physics of AFM - Session III-20131112 1504-1
Recording date:
Tuesday, November 12, 2013 10:04 am
Eastern Standard Time (New York, GMT-05:00)
Panelist Information:
Song Xu, Ph.D., Keysight Technologies, Inc.
Duration:
1 hour
Description:
This is a continuation of the Spring 2013 AFM series
Topic:
原子力显微镜基本原理之-20131113 0304-1
Recording date:
Tuesday, November 12, 2013 10:04 pm
Eastern Standard Time (New York, GMT-05:00)
Panelist Information:
Song Xu, Ph.D., Keysight Technologies, Inc.
Duration:
51 minutes
Description:
近年来,原子力显微镜研究和应用领域的研究和发展非常迅速。陆陆续续许多高级的,非传统的成像模式在文献中发表。对于这一领域的科研工作者,这些眼花缭乱的“高级”成像模式不容易透彻的理解,甚至很多成像模式很容易互相混淆。这次的讲座,我们会选择一些高级成像模式,来剖解一下其背后所包含的物理意义和工作原理,以及所适用的研究领域和所适用的样品。我们会比较详细地讨论从这些高级成像模式里我们能得到什么样的物理信息
Topic:
Session 12: Complex Shear Modulus of Gelatin and Soft Biological Tissue -20131113 1602-1
Recording date:
Wednesday, November 13, 2013 11:02 am
Eastern Standard Time (New York, GMT-05:00)
Panelist Information:
Jennifer Hay. Factory Application Scientist, Keysight Technologies, Inc.
Duration:
57 minutes
Description:
Biological tissue and simulants thereof can be characterized by instrumented indentation using test methods for polymers. However, if the experiment is not well designed, the measured response can easily be on the order of experimental uncertainty. Rigorous uncertainty analysis provides firm guidance for experimental choices. Specifically, it provides guidance on the diameter of the punch which should be used for a particular material. Or, if the punch diameter cannot be changed, uncertainty analysis tells us the most compliant material which can be tested with that punch. The analysis and test method are demonstrated for edible gelatin and bovine muscle tissue.
Topic:
Session 13: The Genius of Oliver and Pharr -20131211 1603-1
Recording date:
Wednesday, December 11, 2013 11:03 am
Eastern Standard Time (New York, GMT-05:00)
Panelist Information:
Jennifer Hay, Factory Applications Engineer, Keysight Technologis, Inc.
Duration:
41 minutes
Description:
In 1992, Warren Oliver and George Pharr published an article that revolutionized hardness testing. The genius of Oliver and Pharr was this: they devised a way to know the size of a hardness indentation without imaging it. This development disrupted Vickers and Knoop microhardness testing which required direct measurement of the lengths of the indentation diagonals. Not having to image the indentation paved the way for fully automated hardness testing. Not only was automated testing independent of human bias, it was also much faster, because multiple tests on multiple samples could be prescribed and executed with no human intervention. Further, the Oliver-Pharr method extended hardness testing to much smaller scales, because one could determine the size of even sub-micron indentations with incredible accuracy. This session explains the theory of the Oliver-Pharr method and shows how it can be used to obtain an equivalent Vickers hardness number (HVc)
Topic:
Session 14: High-Speed Indentation for Mechanical-Properties Mapping -20140212 1601-1
Recording date:
Wednesday, February 12, 2014 11:01 am
Eastern Standard Time (New York, GMT-05:00)
Panelist Information:
Jennifer Hay, Factory Application Scientist, Keysight Technologies, Inc.
Duration:
1 hour 2 minutes
Description:
Scanning-probe microscopy (SPM) has been suggested as a means for mapping the mechanical properties of surfaces. Even under the best conditions, SPM can be used only to assess elastic properties, not plastic strength. A new technique is presented which allows the rapid generation of quantitative and highly resolved mechanical-properties maps. Instead of maintaining continuous contact with the surface, the scanning probe hovers just over the surface and performs an array of discrete indentations. Each indentation cycle requires a just a few seconds, including approach, contact detection, force application, withdrawal, and movement to the next indentation site. Tradition nano-indentation analyses are applied to the force-displacement measurements, but information storage and presentation owe much to SPM technology.
Topic:
原子力显微镜技术:如何从样品的特性出发综合地选择和优化原子力显微镜操作参数来达到最好的分辨律-20140313 0203-1
Recording date:
Wednesday, March 12, 2014 10:03 pm
Eastern Daylight Time (New York, GMT-04:00)
Panelist Information:
Song Xu, Ph.D., Keysight Technologies, Inc.
Duration:
1 hour 5 minutes
Description:
在这次讲座中,我们将讨论如何运用之前讨论过的知识和技能,来对样品进行成像并获得最好成像分辨率。在过去的网上讲座,我们讨论了原子力显微镜的许多课题,如样品置备,针尖选择,成像模式选择,参数优化。在这次讲座中,我们将从一个不同的角度来进行讨论:从样品的特性,研究课题的特性来综合地选择和优化操作变量和参数。即使是同一个样品,不同的样品置备,成像参数的选择,都会有不同的结果。我们将会展示并讨论,不同条件下得到的不同结果。与前几次一样,在这次讲座中,我们将选用具体实例进行探讨和数据分析
Topic:
AFM Techniques: Analyze Your Sample and Research Project in Order to Choose the Right Tip and Parameters for the-20140313 1402-1
Recording date:
Thursday, March 13, 2014 10:02 am
Eastern Daylight Time (New York, GMT-04:00)
Panelist Information:
Song Xu, Ph.D., Keysight Technologies, Inc.
Duration:
1 hour 10 minutes
Description:
This seminar we will discuss how to use the knowledge and skill that we discussed during our past seminars, in order to obtain the best resolution image of a sample. During our past seminars, we cover the individual topics of AFM operation, such as mode choice, imaging media choice, cantilever choice and parameters choice, and sample preparation. In this seminar, we will change our focus to samples and research topics. We will discuss the approach of comprehensive strategies by analyzing the sample itself and research project intentions, by using the existing skills and techniques. While each type of samples may work under more than one type of approach in terms of sample preparation and imaging parameter selection, we will present and discuss different result information that can be obtained under different approaches. Again, just like before, we will make our cases by showing actual case studies and data measurement.
Topic:
Session 15: Measuring Substrate-Independent Young’s Modulus of Thin Films-20140409 1502-1
Recording date:
Wednesday, April 9, 2014 11:02 am
Eastern Daylight Time (New York, GMT-04:00)
Panelist Information:
Jennifer Hay, Factory Applications Scientist, Keysight Technologies, Inc.
Duration:
1 hour 4 minutes
Description:
Substrate influence is a common problem when using instrumented indentation to evaluate the elastic modulus of thin films. In this session, an elastic model for film-substrate interaction is presented which returns accurate film moduli even when substrate influence is substantial. The new model is applied to the interpretation of high-speed indentations on various thin films, including low-k on silicon.
Topic:
最新原子力显微镜产品介绍:安捷伦科技公司7500型科研AFM-20140410 0203-1
Recording date:
Wednesday, April 9, 2014 10:03 pm
Eastern Daylight Time (New York, GMT-04:00)
Panelist Information:
Song Xu, Ph.D., Keysight Technologies, Inc.
Duration:
43 minutes
Description:
这次讲座我们将介绍安捷伦科技公司最新的原子力显微镜技术。安捷伦7500 AFM是我们最新研发的科研型AFM。这型仪器集中了许多独特的设计理念,最新扫描科学技术来满足各种潜在的应用需求。我们将从以下几点来进行讨论: 1. 撓性扫描和集成优化的概念 2. 集成化和模块化的物理构架 3. 全新的5轴结构设计,提高仪器的刚性,减小噪音 4. 特有的集成化全扫描和它的优势 5. 基于以上特点使得仪器的扩展性和应用潜力具有无限的可能性 我们将通过图表、应用案例以及实际图像来展示这款最新的产品。
Topic:
The Latest Development of Keysight Technologies Premium AFM: the 7500 Research AFM-20140410 1403-1
Recording date:
Thursday, April 10, 2014 10:03 am
Eastern Daylight Time (New York, GMT-04:00)
Panelist Information:
Song Xu, Ph.D., Keysight Technologies, Inc.
Duration:
56 minutes
Description:
In this seminar, we will introduce the latest Keysight AFM technology. The Keysight 7500 AFM platform is a research AFM package that has a unique design concept, advanced scanning technology with endless application potentials. We will discuss this latest development in the following topics: 1. The concept of flexure scanning and miniaturizations. 2. The physics of integration and modularity. 3. The latest 5 axis machining fabrication which results in the instrument rigidity and reduced noise. 4. The uniqueness and its benefit of the integrated total scan. 5. The endless possibilities of expanding instrumentation and research resulting from all the above. We will use schematics, application modification examples and actual data to showcase this latest product.
Topic:
纳米压痕测试的基本原理-20140423 0203-1
Recording date:
Tuesday, April 22, 2014 10:03 pm
Eastern Daylight Time (New York, GMT-04:00)
Panelist Information:
Cun-yi Xie, Ph.D., Keysight Technologies, Inc.
Duration:
54 minutes
Description:
谢存毅博士 安捷伦科技(中国)有限公司 本文简要介绍了纳米压痕测试的基础知识,包括主要术语名称,载荷、位移测量方法的选取,对于不同功能的应用如何选择合适形状的压头,基于清楚压痕测试原理后,我们分析了可能影响纳米压痕测试精度或实验结果的各种实验参数。
Topic:
影响纳米压痕测量的主要因素-20140514 0202-1
Recording date:
Tuesday, May 13, 2014 10:02 pm
Eastern Daylight Time (New York, GMT-04:00)
Panelist Information:
Cun-yi Xie, Ph.D., Keysight Technologies, Inc.
Duration:
49 minutes
Description:
为了获得可好的测试结果,我们有必要明白究竟哪些因素会影响到我们的纳米压痕测试结果。中的来说,所有影响因素中可以被分为两类,第一类因素是来自于被测样品,这包括样品表面的粗糙度,材料的非均匀性。第二类因素来自于纳米压痕仪本身,这其中包括热漂移率、框架刚度以及压头的面积函数。本文从原理上分析了这些因素是如何影响测量结果的,进而在实际测量中如何减小它们对测试结果的影响。
Topic:
Indentation Univ Session 16 - Mechanical Characterization of SAC 305 Solder by Instrumented Indentation-20140514 1503-1
Recording date:
Wednesday, May 14, 2014 11:03 am
Eastern Daylight Time (New York, GMT-04:00)
Panelist Information:
Jenny Hay, Senior Application Scientist, Keysight Technologies; Carlos Morillo, PhD University of Maryland (CALCE)
Duration:
54 minutes
Description:
The reliability of soldered connections in electronic packaging depends on mechanical integrity; mechanical failure can cause electrical failure. Mechanical integrity, in turn, depends on mechanical properties. In this presentation, we focus on the SAC 305 solder alloy (96.5% tin, 3% silver, and 0.5% copper) due to its prevalent utilization in electronic packaging. First, we demonstrate the use of nanoindentation to measure the elastic and creep properties of SAC 305. Next, we utilize an advanced form of nanoindentation to quantitatively map mechanical properties of all the components of a realistic SAC 305 solder joint.
Topic:
Exciting New Nano Indenter G200 Capability
Recording date:
Wednesday, May 14, 2014 11:03 am
Eastern Daylight Time (New York, GMT-04:00)
Panelist Information:
Warren Oliver, Naomechanics Inc.
Duration:
Description:
Topic:
Instrument Frame Stiffness and Indenter Area Function Part I: Theory
Recording date:
Panelist Information:
Jennifer Hay , Keysight Technologies
Duration:
Description:
Topic:
Instrument Frame Stiffness and Indenter Area Function Part II: Practice
Recording date:
Panelist Information:
Jennifer Hay, Keysight Technologies
Duration:
Description:
Topic:
动态纳米压痕测试—连续刚度测量技术-20140604 0202-1
Recording date:
Tuesday, June 3, 2014 10:02 pm
Eastern Daylight Time (New York, GMT-04:00)
Panelist Information:
Cun-yi Xie, Ph.D., Keysight Technologies, Inc.
Duration:
46 minutes
Description:
到目前为止,纳米压痕测试技术可以被分为两类,其中一类被称为静态纳米压痕测试,另一类被称为动态纳米压痕测试或称为连续刚度测试技术。本文对连续刚度测量技术的基本原理及其延伸出来的重要应用进行了介绍,这其中包括薄膜材料的纳米压痕中的基地效应的扣除,高分子材料的复模量测试,以及刚度扫描成像技术在复合材料,多相材料以及断裂韧性测试中的应用。
Topic:
Nanoindentation Univ. Session 17 - : Best Practice for Instrumented Indentation-20140611 1502-1
Recording date:
Wednesday, June 11, 2014 11:02 am
Eastern Daylight Time (New York, GMT-04:00)
Panelist Information:
Jenny Hay, Senior Application Scientist, Keysight Technologies
Duration:
1 hour 17 minutes
Description:
The purpose of this presentation is to provide a practical reference guide for instrumented indentation testing. Emphasis is placed on the better-developed measurement techniques and the procedures and calibrations required to obtain accurate and meaningful measurements. Recommended Reading Hay J.L. and Pharr G.M., “Instrumented Indentation Testing,” ASM Handbook: Mechanical Testing and Evaluation, Volume 8, pp. 232-243 (2000).